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Showing posts with the label process monitoring

Using Metrology Data to Improve Manufacturing Decisions

Test and Measurement Technology Connect calibration history, inspection results, equipment use, and process conditions to support focused manufacturing investigations. Contents From Measurement to Process Intelligence: How Metrology Data Improves Manufacturing Why measurement data matters in manufacturing A measurement is the end of one process and the beginning of another A calibrated instrument does not answer every measurement question What a measurement trend can reveal Product change and measurement-system change are different possibilities Repeatability and reproducibility help examine the measurement system Measurement uncertainty changes the meaning of a result One measurement answers a different question than a sequence Connect measurement data with process events How this applies to CMM measurements Calibration history can become part of process information Metrology and Manufacturing From Measurement to Process Intelligence: How Metrology Data Improves Manuf...